The model 2800ISP is BPM Microsystems' production solution for in-system device programming. Combining the unmatched performance and flexibility of 8th Generation site technology with a custom-designed test fixture, operators can easily program flash, microcontrollers and other device technologies on-board after reflow.
Programming flash components in serial mode using traditional test equipment can be expensive and slow. With the 2800ISP, high-density flash memory devices are able to achieve read/write speeds up to 140Mbits per second in parallel mode. This solves the test bottleneck while allowing the operator to program the latest data just-in-time, all while attaining a very low programming cost per device.
BPM Microsystems' technical experts work with your PCB design specifications to provide a custom turn-key solution. The 2800ISP includes the software and hardware to program on-board right out of the box. With a removable pogo-cassette, the programming station can be reconfigured in the future for new jobs. The robust fixture design can provide years of service and allows factories to easily duplicate the process locally and around the world.
Programming Station Features
Semi-automated desktop programming solution
Auto and manual start mode
Pogo pins replaceable in the field
Designed with ESD compliant powder coating
Ergonomic design with easy operation
Low maintenance, long life
Programming Site Features
8th Gen universal technology with Vector Engine BitBlast for unmatched flash programming speeds
Device support for MCUs, high-density flash memory and more
Supports the latest device architectures (OneNAND™, eMMC™, iNAND™, moviNAND™, MLC, SLC, and more)
Ideal for high volume production
Supports device densities up to an 8 Eb theoretical limit
Supports devices with voltage down to 0.7 (Vdd)
20ns verify with Vector Engine Co-Processor technology
16 GB of onboard memory per site
Program up to 16 devices in parallel
Fault-tolerant concurrent architecture
Independent signals to each DUT
High-speed communication to the DUT
Active, Pass, Fail indicators per site and per DUT
